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Low-Contact-Resistance Graphene Devices with Nickel-Etched-Graphene Contacts

机译:具有镍蚀刻石墨烯的低接触电阻石墨烯器件   往来

摘要

The performance of graphene-based transistors is often limited by the largeelectrical resistance across the metal-graphene contact. We report an approachto achieve ultra-low resistance metal contacts to graphene transistors. Througha process of metal-catalyzed etching in hydrogen, multiple nano-sized pits withzigzag edges are created in the graphene that form strong chemical bonds withdeposited nickel metallization for source-drain contacts without the need forfurther annealing. This facile contact treatment prior to electrodemetallization results in contact resistance as low as 100 ohm-um insingle-layer graphene field-effect transistors, and 11 ohm-um in bilayergraphene transistors. The treatment is compatible with complementarymetal-oxide-semiconductor fabrication processes, and holds great promise tomeet the contact performance required for the integration of graphene in futureintegrated circuits.
机译:石墨烯基晶体管的性能通常受到金属-石墨烯触点上较大电阻的限制。我们报告了一种实现与石墨烯晶体管的超低电阻金属触点的方法。通过在氢气中进行金属催化蚀刻的过程,在石墨烯中产生了多个带有锯齿形边缘的纳米尺寸的凹坑,这些凹坑形成了牢固的化学键,并与沉积的镍金属化层形成了源极-漏极接触,而无需进一步退火。在电极金属化之前的这种简单接触处理导致接触电阻低至100 ohm-um的单层石墨烯场效应晶体管,而在双层石墨烯晶体管中的接触电阻低至11 ohm-um。该处理与互补金属氧化物半导体制造工艺兼容,并有望满足未来石墨烯在集成电路中集成所需的接触性能。

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